The dataset consists of six collections of SEM images, three trained U-net AI models, and CSV files with image quality metrics and trained AI model accuracy metrics. Each SEM image collection contains images augmented with Poisson noise and contrast.This work was performed with funding from the CHIPS Metrology Program, part of CHIPS for America, National Institute of Standards and Technology, U.S. Department of Commerce.

Our work towards a Structured Evaluation Methodology for Artificial Intelligence Technology (SEMAIT) aims to provide plots, tools, methods, and strategies to extract insights out of various machine learning (ML) and Artificial Intelligence (AI) data.Included in this software is the MIg analyZeR (mizr) R software package that produces various plots. It was initially developed within the Multimodal Information Group (MIG) at the National Institute of Standards and Technology (NIST).This software is documented, configured to be installed as an R package, and comes with an example SEMAIT script with an example (system, dataset, metrics, score) ML tuple set that we constructed ourselves.

Our work towards a Structured Evaluation Methodology for Artificial Intelligence Technology (SEMAIT) aims to provide plots, tools, methods, and strategies to extract insights out of various machine learning (ML) and Artificial Intelligence (AI) data.Included in this software is the MIg analyZeR (mizr) R software package that produces various plots. It was initially developed within the Multimodal Information Group (MIG) at the National Institute of Standards and Technology (NIST).This software is documented, configured to be installed as an R package, and comes with an example SEMAIT script with an example (system, dataset, metrics, score) ML tuple set that we constructed ourselves.

This resource is the implementation in XML Schema [1] of a data model that describes the Additive Manufacturing Benchmark 2022 series data. It provides a robust set of metadata for the build processes and their resulting specimens and for measurements made on these in the context of the AM Bench 2022 project.The schema was designed to support typical science questions which users of a database with metadata about the AM Bench results might wish to pose. The metadata include identifiers assigned to build products, derived specimens, and measurements; links to relevant journal publications, documents, and illustrations; provenance of specimens such as source materials and details of the build process; measurement geometry, instruments and other configurations used in measurements; and access information to raw and processed data as well as analysis descriptions of these datasets.This data model is an abstraction of these metadata, designed using the concepts of inheritance, normalization, and reusability of an object oriented language for ease of extensibility and maintenance. It is simple to incorporate new metadata as needed.A CDCS [2] database at NIST was filled with metadata provided by the contributors to the AM Bench project. They entered values for the metadata fields for an AM Bench measurement, specimen or build process in tabular spreadsheets. These entries were translated to XML documents compliant with the schema using a set of python scripts. The generated XML documents were loaded into the database with a persistent identifier (PID) assigned by the database.[1] https://www.w3.org/XML/Schema[2] https://www.nist.gov/itl/ssd/information-systems-group/configurable-data-curation-system-cdcs/about-cdcs

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- 항공기 X-RAY 이미지상에서 결함을 자동으로 검출할 수 있는 AI모델 학습용 데이터 52,442장 구축 - 디지털 X-RAY 이미지 및 아날로그 X-RAY를 스캔한 데이터들로 구성

지자체의 도로정비 대상이 되는 도로부속시설물 파손데이터 8종 (정상/파손 16개 클래스)를 탐지하여 도로부속시설물 보수지역 판단 및 예측이 가능한 인공지능 학습용 데이터 구축