3D Solid Model of NIST Nanocalorimeter created in Solidworks 2019. The files include an assembly of three layers represented as part files - the silicon die layer, the silicon nitride membrane layer and the platinum metal layer. Please cite the related paper "Practical Guide to the Design, Fabrication and Calibration of NIST Nanocalorimeters" by Feng Yi, Michael D. Grapes, and David A. LaVan in the Journal of Research of the National Institute of Standards and Technology, Volume 124 (in press).

These software are used to control an instrument that makes measurements and calculates calibration coefficients for NIST nanocalorimeters. Please cite the related paper "Practical Guide to the Design, Fabrication and Calibration of NIST Nanocalorimeters" by Feng Yi, Michael D. Grapes, and David A. LaVan in the Journal of Research of the National Institute of Standards and Technology, Volume 124 (in press).

NaKnowBase 11202020 version submitted with Boyes et al., 2022. This dataset is associated with the following publication: Harten, P., H. Helgen, W. Melendez, B. Beach, W. Boyes, I. Sotiropoulos, P. Karatzas, H. Sarimveis , and H. Mortensen. Mining, refining, and QSAR analysing the nanoinformatics in EPA NaKnowBase. Environmental Science: Nano. Royal Society of Chemistry, Cambridge, UK, 2262-2274, (2024).

Four files are included in this data set for mask generation that can be used to produce photolithography contact masks to create NIST nanocalorimeters. Two different designs are included, each in AutoCAD *.dwg format and a universal *.dxf format. The masks are intended to be printed on 5 inch masks blanks used to pattern 100 mm (4 inch) wafers. The front drawings are used to pattern the metal layer that defines the contact pads and the combined heater / thermometer and includes alignment marks at the center of the mask and at approximately plus and minus 1 inch along the X-axis for front to back alignment. The rear drawings have already been mirrored and define the KOH etch windows used to create individual die and create the windows in the center of the nanocalorimeter. The dimensions of the windows was defined for a standard, nominal, 525 micron thick 100-mm wafer. Please cite the related paper "Guide to the Design, Fabrication and Calibration of NIST Nanocalorimeters" by Feng Yi, Michael D. Grapes, and David A. LaVan in the Journal of Research of the National Institute of Standards and Technology, Volume 124 (in press).

Four files are included in this data set for mask generation that can be used to produce photolithography contact masks to create NIST nanocalorimeters. Two different designs are included, each in AutoCAD *.dwg format and a universal *.dxf format. The masks are intended to be printed on 5 inch masks blanks used to pattern 100 mm (4 inch) wafers. The front drawings are used to pattern the metal layer that defines the contact pads and the combined heater / thermometer and includes alignment marks at the center of the mask and at approximately plus and minus 1 inch along the X-axis for front to back alignment. The rear drawings have already been mirrored and define the KOH etch windows used to create individual die and create the windows in the center of the nanocalorimeter. The dimensions of the windows was defined for a standard, nominal, 525 micron thick 100-mm wafer. Please cite the related paper "Guide to the Design, Fabrication and Calibration of NIST Nanocalorimeters" by Feng Yi, Michael D. Grapes, and David A. LaVan in the Journal of Research of the National Institute of Standards and Technology, Volume 124 (in press).

Nanocalorimeter calibration data. The file format is Origin Pro* project files, which include multiple data worksheets and derived graphs. *Any mention of commercial products is for information only; it does not imply recommendation or endorsement by NIST. Please cite the related paper "Practical Guide to the Design, Fabrication and Calibration of NIST Nanocalorimeters" by Feng Yi, Michael D. Grapes, and David A. LaVan in the Journal of Research of the National Institute of Standards and Technology, Volume 124 (in press).

,Presented research data is the result of structural studies of silica-carbon matrices. The goal of the NCN project (project number: 2021/05/X/ST5/01296), under which the results presented here were performed, was the synthesis and preliminary structural characterization of nanostructured carbon matrices functionalized with propyl-carboxyl groups. The postulated scientific activity was preliminary research for a project devoted to a new type of composite catalytic electrodes. Carbon materials, due to their huge surface area, are widely used in catalytic processes and can act as both catalysts and and catalytic supports. The proposed functional groups will control the distribution of the right catalytic centers. The synthesis of structural silica-carbon complexes was based on three steps: (a) preparation of SBA-15 silica, which was then used as a hard template; (b) through the use of sulfuric acid, a carbon structure was produced from surfactant molecules, which is in the mesopores of the silica; (c) after the carbonization process, highly ordered silica-carbon complexes were obtained. The structures prepared in this way were studied using Raman spectroscopy, thermogravimetry, low-temperature nitrogen sorption. Imaging by scanning electron microscopy (SEM) and transmission electron microscopy (TEM) and energy dispersive X-ray spectrometry (EDS) were also performed. Syntheses and characterization of the obtained materials were performed at the Institute of Nuclear Physics of the Polish Academy of Sciences in Krakow.,

국내 나노기술 관련 현황데이터로 나노기술과 관련된 국가정책, 연구개발 현황, 인프라 현황, 인력양성 및 나노융합산업에 대한 소개와 향후 전망 목차 : 1. 우리나라 나노기술정책 동향 2. 국외 나노기술정책 동향 3.나노기술 연구개발 투자 및 성과 4. 나노산업 현황 5. 나노인프라 현황 6. 인력양성 및 교육·훈련 7. 나노안정성 및 표준화 8. 나노관련 행사, 활동 9. 국제협력, 원조 10. 국민이해 및 지식 확산

Materials discovery and development necessarily begins with the preparation and identification of product phase(s). Crystalline compounds can be identified by their characteristic diffraction patterns using X-rays, neutrons, and or electrons. An estimated 20,000 X-ray diffractometers and a comparable number of electron microscopes are used daily in materials research and development laboratories for this purpose. Access to crystal structure data is a critical step in solving research and applications problems in materials researches, and these data are of interest to analysts in areas such as materials design, property prediction and compound identification. NIST Crystallographic Data Center, in collaboration with partners all over the world, evaluates and disseminates chemical, physical and crystallographic information published on these materials. NIST Standard Reference Database 3: NIST Inorganic Crystal Structure Database (NIST ICSD) is a comprehensive collection of crystal structure data of nonorganic compounds (including inorganics, ceramics, minerals, pure elements, metals, and intermetallic systems) containing over 210,000 entries and covering the literature from 1913. NIST ICSD includes entries that fall into the following categories: full structure data from experimental refinement or derived from their iso-structural structure types, theoretically predicted structures from computer simulations, as well as partially characterized structures. The NIST ICSD web application provides materials researchers with a user-friendly interface to search the database based on bibliographic information, chemistry, unit cell, space group, experimental settings, mineral name/group and other derived data from expert evaluation. In addition, it also provides users with functions to easily create and examine results from various crystallographic computations, such as reduced cell, bond distance/angle, calculated powder diffraction data, and structure standardization.