This dataset represents absorption/transmission spectra of resonant probe light power through a Rydberg atom vapor, subject to a simultaneous dressing field and a 'low frequency' field. Data is taken as an oscilloscope average of 5 photodiode voltage traces, with frequency offsets given by a simultaneous reference cell (not included). Some data are given as 2-D arrays, with axes of laser detuning across a waterfall of field strength. Some data represents theory eigen-energies of the system, for comparison. This paper will be submitted to Physical Review Letters.

This data set consists of both measured and simulated optical intensities scattered off periodic line arrays, with simulations based upon an average geometric model for these lines. These data were generated in order to determine the average feature sizes based on optical scattering, which is an inverse problem for which solutions to the forward problem are calculated using electromagnetic simulations after a parameterization of the feature geometry. Here, the array of features measured and modeled is periodic in one-dimension (i.e., a line grating) with a nominal line width of 100 nm placed at 300 nm intervals, or pitch = 300 nm; the short-hand label for the features is "L100P300." The entirety of the modeled data is included, over two thousand simulations that are indexed using a top, middle, and bottom linewidth as floating parameters. Two subsets of these data, featuring differing sampling strategies, are also provided. This data set also contains angle-resolved optical measurements with uncertainties for nine arrays which differ in their dimensions due to lithographic variations using a focus/exposure matrix, as identified in a previous publication (https://doi.org/10.1117/12.777131). We have previously reported line widths determined from these measurements based upon non-linear regression to compare theory to experiment. Machine learning approaches are to be fostered for solving such inverse problems. Data are formatted for direct use in "Model-Based Optical Metrology in R: MoR" software which is also available from data.nist.gov. (https://doi.org/10.18434/T4/1426859). Note: Certain commercial materials are identified in this dataset in order to specify the experimental procedure adequately. Such identification is not intended to imply recommendation or endorsement by the National Institute of Standards and Technology, nor is it intended to imply that the materials are necessarily the best available for the purpose.

Included here are figures and other relevant data from the paper "Measurements of nonlinear polarization dynamics in the tens of GHz" to be published in Physical Review Applied.Abstract: Frequency-dependent linear permittivity measurements are commonplace in the literature, providing key insights into the structure of dielectric materials. These measurements describe a material's dynamic response to a small applied electric field. In contrast, nonlinear dielectric materials are widely used for their responses to large applied fields, including switching in ferroelectric materials, and field-tuning of the permittivity in paraelectric materials. These behaviors are described by nonlinear permittivity. Nonlinear permittivity measurements are fraught with technical challenges because of the complex electrical coupling between a sample and its environment. Here, we describe a technique for measuring the complex nonlinear permittivity that circumvents many of the difficulties associated with other approaches. We validate this technique by measuring a the nonlinear permittivity of a tunable Ba0.5Sr0.5TiO thin film up to 40 GHz and comparing our results with a phenomenological model. These measurements provide insight into the dynamics of nonlinear dielectric materials down to picosecond timescales.