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Data to accompany "Low Electron Beam Energy X-ray Microanalysis: The Adventure Continues!"
EDS spectra measured at E0 = 5 keV for 75 materials are provided along with the standards used for quantification with the NIST DTSA-II software for electron-excited X-ray microanalysis with energy dispersive spectrometry.The data sets are organized according to the analytical instrument platform used, and an EDS detector configuration appropriate to each EDS spectrometer is provided . Each folder contains spectra for that specific material and the standards used as well as an Excel file summarizing the DTSA-II results in terms of the raw mass concentrations, normalized mass concentrations, and atomic concentrations. Each calculated compositional value is accompanied by the uncertainty budget as estimated by DTSA-II.An Excel file (5keV_accuracy_summary_DTSA-II) containing an overall summary of results for all 75 materials is provided.
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Data accompanying "Simulating Electron-Excited Energy Dispersive X-Ray Spectra with the NIST DTSA-II Open-Source Software Platform" for the MRS 2022 Spring meeting
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The EDS spectra discussed and used to create figures in the MRS journal article "Simulating Electron-Excited Energy Dispersive X-Ray Spectra with the NIST DTSA-II Open-Source Software Platform"
MMS 2 Energetic Particle Detector, Energetic Ion Spectrometer (EPD-EIS) Electron Energy Spectra, Level 2 (L2), Survey Mode, 2.42 s Data
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Energetic Particle Detector (EPD), Energetic Ion Spectrometer (EIS) Electron Energy Spectra, Level 2, Quick-Look Survey, 2.42 s Data. The EIS provides ion composition measurements (protons versus oxygen ions) and angular distributions over the energy range from approximately 45 to 500 keV.
MMS 4 Energetic Particle Detector, Energetic Ion Spectrometer (EPD-EIS) Electron Energy Spectra, Level 2 (L2), Survey Mode, 2.42 s Data
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Energetic Particle Detector (EPD), Energetic Ion Spectrometer (EIS) Electron Energy Spectra, Level 2, Quick-Look Survey, 2.42 s Data. The EIS provides ion composition measurements (protons versus oxygen ions) and angular distributions over the energy range from approximately 45 to 500 keV.
MMS 3 Energetic Particle Detector, Energetic Ion Spectrometer (EPD-EIS) Electron Energy Spectra, Level 2 (L2), Survey Mode, 2.42 s Data
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Energetic Particle Detector (EPD), Energetic Ion Spectrometer (EIS) Electron Energy Spectra, Level 2, Quick-Look Survey, 2.42 s Data. The EIS provides ion composition measurements (protons versus oxygen ions) and angular distributions over the energy range from approximately 45 to 500 keV.
MMS 1 Energetic Particle Detector, Energetic Ion Spectrometer (EPD-EIS) Electron Energy Spectra, Level 2 (L2), Survey Mode, 2.42 s Data
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Energetic Particle Detector (EPD), Energetic Ion Spectrometer (EIS) Electron Energy Spectra, Level 2, Quick-Look Survey, 2.42 s Data. The EIS provides ion composition measurements (protons versus oxygen ions) and angular distributions over the energy range from approximately 45 to 500 keV.
High Energy Laboratory Astrophysics using an X-Ray Microcalorimeter with an Electron Beam Ion Trap Project
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"Since the summer of 2000 we have successfully deployed a high resolution x-ray microcalorimeter spectrometer, based on the spaceflight XRS instrument, at the Electron Beam Ion Trap (EBIT) facility at the Lawrence Livermore National Laboratory. Over the last decade, this highly successful partnership has made fundamental measurements in laboratory astrophysics including the measurements of the absolute cross sections of all the Fe L shell transitions from Fe XVII to Fe XXIV, line ratios in Fe and Ni L shell transitions, measurements of Fe K shell emission over a wide range of electron energies, and direct measurements of charge exchange emission from highly ionized Fe, O, N, and most recently L shell S, using a variety of donor gases. This work has resulted in the publication of over 30 peer-reviewed articles with many more either submitted or in preparation. The newest addition to the facility, the ECS microcalorimeter spectrometer, developed under this program, has performed flawlessly as a facility-class instrument since 2007. We propose here to continue our highly successful partnership and deploy new technology to resolve lines in the important 1/4 keV band that encompasses the M-shell iron emission and the L shell emission, including charge exchange, of many of the lower-Z elements, such as Si, S, Mg, Ne, Ca, and Ar. We thus propose completing a new spectrometer that will bring substantially improved performance to the laboratory astrophysics program at EBIT and will enable fundamentally new measurements. Thus, in addition to maintaining the current spectrometers, which will begin this work, a significant component of this proposal is the completion of a new spectrometer leveraged off of the substantial progress in high-resolution x-ray detectors developed for the International X-ray Observatory mission. The spectrometer will be composed of a detector system with unparalleled spectral resolution: 2 eV resolution across the 0.05-10 keV band. This will allow
NIST SRM 2135c Hyperspectral Tomography Tilt Series
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Energy dispersive X-ray spectroscopy (EDX) tomographic tilt series of a needle-shaped sample extracted from NIST SRM 2135c.Sample description: This SRM consists of alternating layers of nickel and chromium on a silicon substrate (see SRM certificate for further detail).Data description. The scan size for each spectrum image (SI) is 128 pixels x 100 pixels and 4000 spectral channels deep. EDX data were collected using the following parameters:Beam energy (keV): 300.0Probe current: 0.5 nAPixel size: 3.0 nmDwell time per pixel: 200 msecEnergy resolution: 10 eV/channelThe SI's were collected over a 180 degree range of specimen tilts with a 5 degree tilt step between each acquisition.
NIST Electron Elastic-Scattering Cross-Section Database - SRD 64
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Note that this SRD supersedes SRD 64 Version 3.2. The NIST Electron Elastic-Scattering Cross-Section Database provides values of differential elastic-scattering cross sections, total elastic-scattering cross sections, phase shifts, and transport cross sections in electron-atom scattering for elements with atomic numbers from 1 to 96 and for electron energies between 50 eV and 300 keV (in steps of 1 eV). Knowledge of elastic-scattering effects is important for the development of theoretical models for quantitative analysis by Auger-electron spectroscopy, X-ray photoelectron spectroscopy, electron microprobe analysis, and analytical electron microscopy. These data are also needed for modeling of electron transport in radiation dosimetry, electron-beam lithography, and interactions of ionizing radiation with matter. The database is designed to facilitate simulations of electron transport for these and similar applications in which electron energies from 50 eV to 300 keV are utilized. An analysis of available elastic-scattering cross-section data has been published [A. Jablonski, F. Salvat, and C. J. Powell, J. Phys. Chem. Ref. Data 33, 409 (2004)].
FAST Electrostatic Analyzer (ESA), Electron Burst 0.156 s Data
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The FAST IES and EES measure 32 pitch angle directions simultaneously, 11.25° resolution, and sweep over 48 energy steps in 1/64 of a spacecraft spin. The energy range is nominally 3 eV to 25 keV for ions and 4 eV to 30 keV for electrons, respectively. Each spectrometer consists of two half sensor heads each with 180° by 10° field-of-view, FOV, that are mounted on opposite sides of the spacecraft to form a 360° planar FOV. The out-of-plane response is roughly Gaussian with a full width, half maximum, FWHM, of about 5°. The planar FOV is within the spacecraft spin plane, which is oriented with the spin vector normal to the nominal magnetic field direction. This orientation facilitates continuous pitch angle measurements. Deflectors are used to steer the sensor FOV out of this plane by up to 10° to account for variations of the magnetic field direction during the orbit. In general, the pitch angle distribution always includes both the parallel and Anti-parallel magnetic field directions. Burst data consists of a 32 angle by 48 anergy bin array of counts. Counts are pseudo-log compressed from 16 to 8 bits onboard. The first energy step is a high voltage retrace and should be ignored. Detector anodes rotate by half an anode or 5.625° each sweep. Survey data is averaged burst data that has been despun onboard. Slow survey is averaged into a 32 angle by 48 energy array each half spin or about 2.5 s. Some blurring of the angular resolution results from the half anode rotation on alternate sweeps. Fast survey is averaged into a 64 angle by 48 energy array that maintains the angular resolution. Fast survey time resolution varies from 1/16 to 1/4 of a spin.
MMS 2 Energetic Particle Detector, Energetic Ion Spectrometer (EPD-EIS) Energy by Time of Flight, Level 2 (L2), Burst Mode, 0.605 s Data
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Energetic Particle Detector (EPD), Energetic Ion Spectrometer (EIS) Energy by Time of Flight, Level 2, Burst Survey, 0.605 s Data. The EIS provides ion composition measurements (protons versus oxygen ions) and angular distributions over the energy range from approximately 45 to 500 keV.