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Supporting Data for Selected Area Electron Beam Induced Deposition of Pt and W for EBSD Backgrounds
These are the unprocessed electron back scatter diffraction patterns (EBSPs) collected from the mesas of electron beam induced deposition (EBID) material, in addition to the Mathematica notebook used to process the images. Each of the 12 EBID mesa has 10 EBSPs collected at 20 kV and 10 kV, in addition to several longer line scans that step from the silicon substrate onto the EBID mesa.
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Supporting Data for Selected Area Electron Beam Induced Deposition of Pt and W for EBSD Backgrounds
공공데이터포털
These are the unprocessed electron back scatter diffraction patterns (EBSPs) collected from the mesas of electron beam induced deposition (EBID) material, in addition to the Mathematica notebook used to process the images. Each of the 12 EBID mesa has 10 EBSPs collected at 20 kV and 10 kV, in addition to several longer line scans that step from the silicon substrate onto the EBID mesa.
Data accompanying "Simulating Electron-Excited Energy Dispersive X-Ray Spectra with the NIST DTSA-II Open-Source Software Platform" for the MRS 2022 Spring meeting
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The EDS spectra discussed and used to create figures in the MRS journal article "Simulating Electron-Excited Energy Dispersive X-Ray Spectra with the NIST DTSA-II Open-Source Software Platform"
NIST NIST Backscattering-Correction-Factor Database for Auger Electron Spectroscopy - SRD 154
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This database provides values of backscattering correction factors (BCF) of homogeneous materials for quantitative surface analyses by Auger electron spectroscopy. These BCFs are obtained from Monte Carlo simulations based on two models of electron transport in the material, a simplified model and an advanced model [A. Jablonski and C. J. Powell, Surf. Science 604, 1928 (2010)]. One assumption for the former model is that the primary-electron beam is unchanged, in intensity, energy or direction, within the information depth for Auger-electron emission. This assumption becomes progressively less useful as the primary energy becomes closer to the core-level ionization energy for the relevant Auger transition or for increasing angles of incidence of the primary electrons.
NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) - SRD 100
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The NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) can be used to simulate Auger-electron spectra and X-ray photoelectron spectra of nanostructures such as islands, lines, spheres, and layered spheres on surfaces. As for earlier versions, such simulations can be performed for multilayer films. Users can specify the compositions and dimensions of each material in the sample structure as well as the measurement configuration. The database contains extensive physical data needed for quantitative interpretations of observed spectra. A more detailed description of SESSA has been published [W. Smekal, W. S. M. Werner, and C. J. Powell Surf. Interface Anal. 37, 1059 (2005)].
Data for the paper "EIT spectra of Rydberg atoms dressed with dual tone radio-frequency fields"
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This dataset contains the data for the figures in the paper "EIT spectra of Rydberg atoms dressed with dual tone radio-frequency fields", submitted to Physical Review A. This dataset can be used to recreate the experimental and theory plots from the CSV files. The data show EIT spectra of Rydberg atoms driven with dual-tone RF fields (experimental), and Floquet spectra of numerical models that are used to model these EIT spectra (theory/numerical). The data demonstrate spectra of driven Rydberg atoms in the strong field regime, and the models demonstrate the applicability of two-level Floquet spectra to reproduce the dominant spectral features.
Dataset demonstrating feasibility of two-ladder sensing approach
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Datasets included in manuscript on simultaneous two-ladder sensing, titled "Independent Rydberg Atom Sensing using a Dual-Ladder Scheme" to be submitted to Applied Physics Letters. The data for figure 1 contains experimental EIT traces for both ladders, and figure 2 contains the data for false-color plots showing the polarization-specific response of each ladder.