Data associated with the publication: "Two-dimensional imaging of electromagnetic fields via light sheet fluorescence imaging with Rydberg atoms"Abstract:The ability to image electromagnetic fields holds key scientific and industrial applications, including electromagnetic compatibility, diagnostics of high-frequency devices, and experimental scientific work involving field interactions. Generally electric and magnetic field measurements require conductive elements which significantly perturb the field. However, electromagnetic fields can be measured non-perturbatively via the shift they induce on Rydberg states of alkali atoms in atomic vapor, which are highly sensitive to electric fields. Previous field measurements using Rydberg atoms utilized electromagnetically induced transparency to read out the shift on the states induced by the fields, but did not provide spatial resolution. In this work, we demonstrate that electromagnetically induced transparency can be spatially resolved by imaging the fluorescence of the probe. We demonstrate that this can be used to image $\sim$V/cm scale electric fields in the MHz-GHz range and $\sim$mT scale static magnetic fields, with minimal perturbation to the fields. We also demonstrate the ability to image $\sim$ V/m scale fields for resonant microwave radiation, although standing waves generated by the vapor cell walls obscure external field structure in this regime. We perform this field imaging with a spatial resolution of order 160 $\mu$m.This dataset contains the data associated with Figure 1 c,f,g, and h, Figure 2, Figure 3 b,d,f, and h, Figure 4 c,d, and e, Figure 5 b, c, and e, Figure 6, and the Supplemental Material's Figure 1.

We present recent improvements within the growing field of Rydberg atom sensors. While initially started as a path towards absolute, independent measurements of electric fields, the research landscape has evolved into the realm of quantum sensors and receivers. We discuss the capabilities and limitations of Rydberg atom receivers, and we show how different atomic properties enhance or limit sensitivity and bandwidth.This data is for a review paper. Figures 6 (a) and 8 (a) and (b) are new data. The rest of the data is extracted from other NIST publications that have a data management plan. Related data are from the following papers.https://doi.org/10.1063/5.0069195https://doi.org/10.48550/arXiv.2402.00718https://doi.org/10.1116/5.0098057

Datasets included in manuscript on simultaneous two-ladder sensing, titled "Independent Rydberg Atom Sensing using a Dual-Ladder Scheme" to be submitted to Applied Physics Letters. The data for figure 1 contains experimental EIT traces for both ladders, and figure 2 contains the data for false-color plots showing the polarization-specific response of each ladder.

Datasets included in manuscript on simultaneous two-ladder sensing, titled "Independent Rydberg Atom Sensing using a Dual-Ladder Scheme" to be submitted to Applied Physics Letters. The data for figure 1 contains experimental EIT traces for both ladders, and figure 2 contains the data for false-color plots showing the polarization-specific response of each ladder.

This dataset contains the data for the figures in the paper "EIT spectra of Rydberg atoms dressed with dual tone radio-frequency fields", submitted to Physical Review A. This dataset can be used to recreate the experimental and theory plots from the CSV files. The data show EIT spectra of Rydberg atoms driven with dual-tone RF fields (experimental), and Floquet spectra of numerical models that are used to model these EIT spectra (theory/numerical). The data demonstrate spectra of driven Rydberg atoms in the strong field regime, and the models demonstrate the applicability of two-level Floquet spectra to reproduce the dominant spectral features.

The NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) can be used to simulate Auger-electron spectra and X-ray photoelectron spectra of nanostructures such as islands, lines, spheres, and layered spheres on surfaces. As for earlier versions, such simulations can be performed for multilayer films. Users can specify the compositions and dimensions of each material in the sample structure as well as the measurement configuration. The database contains extensive physical data needed for quantitative interpretations of observed spectra. A more detailed description of SESSA has been published [W. Smekal, W. S. M. Werner, and C. J. Powell Surf. Interface Anal. 37, 1059 (2005)].