This dataset is for the publication entitled "LABORATORY-BASED REFERENCE CHANNELS FOR MILLIMETER-WAVE WIRELESS DEVICE MEASUREMENTS." The dataset includes results from experiments in a simulated industrial wireless channel operated at 28 GHz. Results include synthetic-aperture beamforming data, and error-vector-magnitude information calculated from synthetic-aperture and directional-antenna measurements.

The data correspond to the paper Practical Correlation-Matrix Approaches for Standardized Testing of Wireless Devices in Reverberation Chambers. Abstract: We extend the autocorrelation-based approaches currently used in standards to full correlation matrix-based approaches in order to identify correlation between both spatially adjacent and non-adjacent samples in reverberation-chamber measurements. We employ a scalar metric that allows users to identify the number of effectively uncorrelated samples in new types of stirring sequences. To make these approaches practical and enhance their accuracy, we implement a thresholding technique that retains correlation related to important aspects of chamber configuration such as loading and undermoded conditions. We develop a method to propagate uncertainty in the complex correlation coefficients through to the number of effective samples for a given reverberation-chamber set-up by use of a bootstrap technique that is accurate even for highly skewed distributions of correlation coefficients. We further apply this method in a sensitivity studyregarding the choice threshold value. Agreement with existing approaches in determining the number of effectively uncorrelated samples is presented for a measurement example where spatially adjacent samples are utilized. Examples are then illustrated for non-spatially-adjacent correlated samples at microwave and millimeter-wave frequencies.

This is a collection of data sets acquired for measurements of noise figure and receive system noise of wireless/radio frequency receivers and transceivers. These data include tabular data that list1) Inputs: calibrated input signal and excess noise levels, and2) Outputs: summary statistics for each type of user data collected for each DUT.The experiments that produced these data were meant to be used to assess noise measurands, but the data are generic and could be applied to other problems if desired.The structure of each zip archive dataset is as follows:| Root|-- (Anonymized DUT name 1)|---- Data file 1|---- Data file 2|---- ...Data file N|---- DUT-README.txt|-- (Anonymized DUT name 2)|---- Data file 1|---- Data file 2|---- ...Data file N|---- DUT-README.txt| (etc.)Data tables in each archive are provided as comma-separated values (.csv), and the descriptive text files are ASCII (.txt). Detailed discussion of the test conditions and data formatting is given by the DUT-README.txt for each DUT.

In this paper, we have demonstrated the importance of choosing the correct reference plane for applications such as over-the-air (OTA) modulated-signal measurements at millimeter-wave frequencies. We have employed a modulated-signal source at 44 GHz for this demonstration. The measurements have been performed using NIST's calibrated sampling oscilloscope and are traceable to the primary standards. The EVM values and distributions are obtained after complete uncertainty analyses. The source and oscilloscope mismatch measurements have been performed on a vector network analyzer (VNA) and are also shown here after complete uncertainty analyses. Each dataset shown in the paper has been obtained after running 1000 Monte-Carlo simulations.

The dataset can be used to develop and test algorithms for communication and sensing in the 60GHz band. The dataset consists of synthetically generated indoor mm-wave channels between a MIMO transmitter and a MIMO receivers. Multiple targets are moving in the room. Number of targets, velocity of each target and trajectory are randomized across the dataset. The dataset contains also noisy received IEEE 802.11ay channel estimation fields. The dataset is suitable for development and testing of machine/deep learning algorithms. The dataset can be used to participate to the ITU AI/ML 5G Challenge. For information on the challenge and registration, please refer to: https://challenge.aiforgood.itu.int/match/matchitem/38. The challenge dataset relies on the open-source software available at: https://github.com/usnistgov/PS-002-WALDO.

data published in paper "On-Wafer Device Characterization Including Uncertainty Estimates to 1.0 THz"This dataset contains the calibrated scattering parameters (S-parameters) of a thru that was not used in calibration, and the simulated and calibrated S-parameters for series and shunt capacitors for both technology 1 and technology 2. It also contains the simulated and extracted capacitance from these S-parameters of the series and shunt capacitors. It contains the simulated and extracted capacitance for the shunt capacitor from one site in technology 1 and 95% prediction intervals (uncertainties) from electronic variation in the vector network analyzer (VNA), probe placement error, and the capacitance per unit length correction variation. Finally, it contains the extracted capacitance for multiple sites for the shunt capacitor in technology 1. All simulated S-parameters obtained using a 2.5D method of moments commercial solver. Simulated capacitance obtained from the simulated S-parameters.

data published in paper "On-Wafer Device Characterization Including Uncertainty Estimates to 1.0 THz"This dataset contains the calibrated scattering parameters (S-parameters) of a thru that was not used in calibration, and the simulated and calibrated S-parameters for series and shunt capacitors for both technology 1 and technology 2. It also contains the simulated and extracted capacitance from these S-parameters of the series and shunt capacitors. It contains the simulated and extracted capacitance for the shunt capacitor from one site in technology 1 and 95% prediction intervals (uncertainties) from electronic variation in the vector network analyzer (VNA), probe placement error, and the capacitance per unit length correction variation. Finally, it contains the extracted capacitance for multiple sites for the shunt capacitor in technology 1. All simulated S-parameters obtained using a 2.5D method of moments commercial solver. Simulated capacitance obtained from the simulated S-parameters.

,1) Właściwości fizyczne pasm 169 MHz, 433 MHz, 868 MHz, 2,4GHz.,2) Opis modulacji stosowanej w transmisji cyfrowej LoRa.,3) Dobór układu nadawczo - odbiorczego.,4) Badanie zasięgu poszczególnych zakresów fal przy tej samej mocy nadawania w otwartej przestrzeni.,5) Badanie podatność na pochłanianie fal w poszczególnych zakresach dla drewna, betonu, żelbetonu, cegły, metalu.,6) Dobór anteny w urządzeniu.,7) Badanie jakości różnych rodzajów anten.,8) Optymalizacja energetyczna.,9) Uzasadnienie wyboru częstotliwości i parametrów modulacji.,10) Wybór chipsetu do modułu radiowego.,11) Dobór najkorzystniejszych parametrów pracy układu SX1276.,12) Opracowanie płytki prototypowej.,13) Testy w warunkach laboratoryjnych.,14) Testy w warunkach rzeczywistych.,15) Wybór chipsetu.,16) Oszacowanie prądów.,17) Opracowanie płytki prototypowej Bezprzewodowej Anteny (BA).,18) Opracowanie płytki prototypowej Bezprzewodowego Koncentratora (BK).,19) Testy w warunkach laboratoryjnych.,20) Testy w warunkach rzeczywistych.,21) Podsumowanie i wnioski.,

As a National Metrology Institute (NMI), the National Institute of Standards and Technology (NIST) maintains traceable measurement capabilities for a variety of quantities, including microwave power. At NMIs and calibration laboratories, traceable microwave power measurements often rely on the principle of dc substitution. This approach involves a power meter that provides dc power to a sensor under test. DC substitution power meters are typically implemented by analog electronics, making them difficult to maintain. Here, we explore programmable source measure units as an alternative implementation of the power meter. We offer a preliminary uncertainty analysis and describe a method to reduce measurement uncertainty due to the accuracy of the measurement equipment. This is data for the manuscript "Using Commercial Source Measure Units for Traceable RF Power Measurements" for the 2024 ARFTG conference.