The experiment here was to demonstrate that we can reliably measure the Reference Waveforms designed in the IEEE P1765 proposed standard and calculate EVM along with the associated uncertainties. The measurements were performed using NIST's calibrated sampling oscilloscope and were traceable to the primary standards.We have uploaded the following two datasets. (1) Table 3 contains the EVM values (in %) for the Reference Waveforms 1--7 after performing the uncertainty analyses. The Monte Carlo means are also compared with the ideal values from the calculations in the IEEE P1765 standard.(2) Figure 3 shows the complete EVM distribution upon performing uncertainty analysis for Reference Waveform 3 as an example. Each of the entries in Table 3 is associated with an EVM distribution similar to that shown in Fig. 3.