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Cryogenic On-chip In Situ S-parameter Calibration Using Superconducting Coplanar Waveguides
These data will appear in [1]. The abstract for that paper is given below:This paper presents a new multi-impedance-state line (MISL) in situ scattering parameter (S-parameter) calibration technique using on-chip superconducting transmission lines at 4 K that enables cryogenic calibration in a fixed signal path without the need for cryogenic switches or a cryogenic probe station. The method uses coplanar waveguide (CPW) models based on various impedance states of niobium (Nb), which has zero dc resistance below 9 K and a monotonically increasing resistance from 10 K to room temperature. The different impedance states are accessed by heating the 4 K stage of a cryostat and injecting up to 245 mA of current into the line. Using these states, we solve for the unknowns in an 8-term error model through a least-squares analysis. We first validate the MISL calibration technique by comparing it with short-open-load-reciprocal (SOLR) calibrated measurements in a cryogenic probe station, finding transmission agreement within 0.2 dB and uncertainty overlap for nearly all frequencies up to 26.5 GHz. We then apply the method to calibrate Nb CPWs with and without embedded Josephson junctions (JJs), using a fixed wire bonded connection, and without the use of cryogenic switches or movable probes. Strong agreement with the CPW models is demonstrated, with uncertainty overlap and differences below 0.1 dB up to 4.6 GHz without JJs and up to 2.4 GHz with JJs; resonances cause interruptions beyond these frequencies.[1] Thomas, J. N., Hoffmann, J., Flowers-Jacobs, N. E., Fox, A. E., Jungwirth, N. R., Johnson-Wilke, R. L., Dresselhaus, P. D., & Benz, S. P., "Cryogenic On-chip In Situ S-parameter Calibration Using Superconducting Coplanar Waveguides" submitted to the IEEE Transactions on Microwave Theory and Techniques Journal which if accepted will be published and available on IEEE website at a later date.
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Digital control of a superconducting qubit using a Josephson pulse generator at 3 K
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Included here are data used to generate figures from the paper "Digital control of a superconducting qubit using a Josephson pulse generator at 3 K".Abstract: Scaling of quantum computers to fault-tolerant levels relies critically on the integration of energy-efficient, stable, and reproducible qubit control and readout electronics. In comparison to traditional semiconductor control electronics (TSCE) located at room temperature, the signals generated by Josephson junction (JJ) based rf sources benefit from small device sizes, low power dissipation, intrinsic calibration, superior reproducibility, and insensitivity to ambient fluctuations. Previous experiments to co-locate qubits and JJ-based control electronics resulted in quasiparticle poisoning of the qubit; degrading the qubit's coherence and lifetime. In this paper, we digitally control a 0.01~K transmon qubit with pulses from a Josephson pulse generator (JPG) located at the 3~K stage of a dilution refrigerator. We directly compare the qubit lifetime $T_1$, coherence time $T_2^*$, and thermal occupation $P_{th}$ when the qubit is controlled by the JPG circuit versus the TSCE setup. We find agreement to within the daily fluctuations on $\pm 0.5~\mu$s and $\pm 2~\mu$s for $T_1$ and $T_2^*$, respectively, and agreement to within the 1\% error for $P_{th}$. Additionally, we perform randomized benchmarking to measure an average JPG gate error of $2.1 imes 10^{-2}$. In combination with a small device size ($<25$~mm$^2$) and low on-chip power dissipation ($\ll 100~\mu$W), these results are an important step towards demonstrating the viability of using JJ-based control electronics located at temperature stages higher than the mixing chamber stage in highly-scaled superconducting quantum information systems
AC Metrology Applications of the Josephson Effect
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Datasets for the four published figures in the Paper "AC Metrology Applications of the Josephson Effect ". This paper is being submitted to Applied Physics Letters Special Topic, "Advances in Quantum Metrology,"https://publishing.aip.org/publications/journals/special-topics/apl/advances-in-quantum-metrology/ .Abstract of the paper:The performance of programmable voltage signals that exploit the quantum behavior of superconducting Josephson junctions continues to improve and enable new capabilities for applications in metrology, communications, and quantum control. We review advances in pulse-driven digital synthesis techniques with Josephson-junction-based devices. Unprecedented performance for synthesized voltage waveforms has been achieved at different frequencies, including rms amplitudes of 4 V at 1 kHz, 50 mV at 50 MHz, and 22 mV at 1.005 GHz. Josephson pulse generators have also successfully controlled and characterized superconducting qubits with a gate fidelity of 99.5%.
Superfund Site Information - Site Sampling Data
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This asset includes Superfund site-specific sampling information including location of samples, types of samples, and analytical chemistry characteristics of samples. Information is associated with a particular contaminated sate as there is no national database of this information.
Data for "Characterizing Interconnects to 325 GHz" to be submitted to "Transactions on Microwave Theory and Techniques"
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Included here are figures and other relevant data from the paper "Characterizing Interconnects to 325 GHz". Abstract: We developed an interconnect characterization procedure that first embeds the interconnect into the error boxes of a multiline thru-reflect-line calibration and subsequently de-embeds the interconnect with a multi-tiered calibration. We experimentally validated our method with distributed contactless interconnects in the form of broadside coupled coplanar waveguides as a test case. We find excellent agreement between experiment, full-wave simulations, and a distributed model of contactless interconnects. This work provides a rigorous method to accurately characterize interconnects when conventional approaches are not applicable.
Quasi Thermal Noise pectroscopy on High Frequency Receiver Data Bundle
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This bundle contains RPWS-HFR Quasi Thermal Noise (QTN) spectroscopy supplied CDF and plot files containing a time series of thermal plasma moments (density and temperature). QTN data products are generated only when the QTN analysis is applicable.
Microstrip and Grounded CPW Calibration Kit Comparison for On-Wafer Transistor Characterization from 220 GHz to 325 GHz
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Data published in paper "Microstrip and Grounded CPW Calibration Kit Comparison for On-Wafer Transistor Characterization from 220 GHz to 325 GHz"We investigated the effect of two uncertainty sources, probe placement error and capacitance per unit length variation, on transistor S-parameter measurements calibrated with two different mTRL calibration kits. We propagated these uncertainties onto common-emitter (CE) and common-base (CB) heterojunction-bipolar-transistor (HBT) measurements to show how the calibration kit selection affects the accuracy of the resulting S-parameter transistor measurements and calculated characterization metrics such as K factor and maximum available gain (MAG). The measured data are from Sparameters taken from a Vector Network Analyzer (VNA). We used WR3.4 extender heads connected to a VNA and measured S-parameters from 210 GHz to 325 GHz with a 500 MHz frequency step. The probes were landed manually for each of calibration standard measurements and transistor measurements with an approximate probe landing error of +/- 10 um. Each raw measurement was stored and corrected later in post-processing using the mTRL calibration algorithm in the Microwave Uncertainty Framework (MUF). In this dataset, we also included the capacitance per unit length from a commercial Electromagnetic (EM) solver of the two transmission line cross sections used in the calibration kits. We varied the geometric and material properties of the transmission lines to obtain the histograms.
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