Data for "Preparing for 6G: Developing best practices and standards for industrial measurements of low-loss dielectrics"

한국방송통신전파진흥원의 재정지원을 통해 이루어진 전파검사분야의 연구자료로 5G/6G 시대에 대비하여 현 제도를 분석하고 중장기 인체보호제도 개선방안에 관한 연구 보고서입니다. ※ PDF형태의 자료를 다운로드하실 수 있습니다.

As a National Metrology Institute (NMI), the National Institute of Standards and Technology (NIST) maintains traceable measurement capabilities for a variety of quantities, including microwave power. At NMIs and calibration laboratories, traceable microwave power measurements often rely on the principle of dc substitution. This approach involves a power meter that provides dc power to a sensor under test. DC substitution power meters are typically implemented by analog electronics, making them difficult to maintain. Here, we explore programmable source measure units as an alternative implementation of the power meter. We offer a preliminary uncertainty analysis and describe a method to reduce measurement uncertainty due to the accuracy of the measurement equipment. This is data for the manuscript "Using Commercial Source Measure Units for Traceable RF Power Measurements" for the 2024 ARFTG conference.

This dataset is for the publication entitled "LABORATORY-BASED REFERENCE CHANNELS FOR MILLIMETER-WAVE WIRELESS DEVICE MEASUREMENTS." The dataset includes results from experiments in a simulated industrial wireless channel operated at 28 GHz. Results include synthetic-aperture beamforming data, and error-vector-magnitude information calculated from synthetic-aperture and directional-antenna measurements.

Included here are figures and other relevant data from the paper "Measurements of nonlinear polarization dynamics in the tens of GHz" to be published in Physical Review Applied.Abstract: Frequency-dependent linear permittivity measurements are commonplace in the literature, providing key insights into the structure of dielectric materials. These measurements describe a material's dynamic response to a small applied electric field. In contrast, nonlinear dielectric materials are widely used for their responses to large applied fields, including switching in ferroelectric materials, and field-tuning of the permittivity in paraelectric materials. These behaviors are described by nonlinear permittivity. Nonlinear permittivity measurements are fraught with technical challenges because of the complex electrical coupling between a sample and its environment. Here, we describe a technique for measuring the complex nonlinear permittivity that circumvents many of the difficulties associated with other approaches. We validate this technique by measuring a the nonlinear permittivity of a tunable Ba0.5Sr0.5TiO thin film up to 40 GHz and comparing our results with a phenomenological model. These measurements provide insight into the dynamics of nonlinear dielectric materials down to picosecond timescales.

We present a method for accurately determining the permittivity of dielectric materials in 3D integrated structures at broadband RF frequencies. With applications of microwave and millimeter-wave electronics on the rise, reliable methods for measuring the electrical properties of dielectrics used in integrated circuits are critical. We outline an on-wafer method for extracting the permittivity of a 3D multilayer glass structure from 100 MHz to 30 GHz using S-parameter measurements of different calibration chips. Our method can be used to inform better design of metrology for dielectric materials for 3D integrated circuit technologies.This is data associated with the manuscript "Characterizing the broadband RF permittivity of 3D-integrated layers in a glass wafer stack from 100 MHz to 30 GHz" for the 2024 International Microwave Symposium (IMS) in Washington, D.C. The manuscript is currently under review by ERB in the NPS system under PUB ID 957051 / N2024-0193

회전기기 결함모사 테스트베드를 이용한 정상/결함 데이터

Included here are figures and other relevant data from the paper "Characterizing Interconnects to 325 GHz". Abstract: We developed an interconnect characterization procedure that first embeds the interconnect into the error boxes of a multiline thru-reflect-line calibration and subsequently de-embeds the interconnect with a multi-tiered calibration. We experimentally validated our method with distributed contactless interconnects in the form of broadside coupled coplanar waveguides as a test case. We find excellent agreement between experiment, full-wave simulations, and a distributed model of contactless interconnects. This work provides a rigorous method to accurately characterize interconnects when conventional approaches are not applicable.

실 방사 시의 온도, 냉각 조건, 노즐 속도 등 공정 변수 기록 [개요] ㅇ 대상기간 : 2022~2024년 ㅇ 실 방사 시의 온도, 냉각 조건, 노즐 속도 등 공정 변수 기록 [특징] 방사, 열처리, 가공 공정에서의 온도, 시간, 압력 조건 등 [사례] [품질 개선] 실 균일성, 굵기 안정성 향상을 위한 최적 공정 설계