Cryogenic On-chip In Situ S-parameter Calibration Using Superconducting Coplanar Waveguides
공공데이터포털
These data will appear in [1]. The abstract for that paper is given below:This paper presents a new multi-impedance-state line (MISL) in situ scattering parameter (S-parameter) calibration technique using on-chip superconducting transmission lines at 4 K that enables cryogenic calibration in a fixed signal path without the need for cryogenic switches or a cryogenic probe station. The method uses coplanar waveguide (CPW) models based on various impedance states of niobium (Nb), which has zero dc resistance below 9 K and a monotonically increasing resistance from 10 K to room temperature. The different impedance states are accessed by heating the 4 K stage of a cryostat and injecting up to 245 mA of current into the line. Using these states, we solve for the unknowns in an 8-term error model through a least-squares analysis. We first validate the MISL calibration technique by comparing it with short-open-load-reciprocal (SOLR) calibrated measurements in a cryogenic probe station, finding transmission agreement within 0.2 dB and uncertainty overlap for nearly all frequencies up to 26.5 GHz. We then apply the method to calibrate Nb CPWs with and without embedded Josephson junctions (JJs), using a fixed wire bonded connection, and without the use of cryogenic switches or movable probes. Strong agreement with the CPW models is demonstrated, with uncertainty overlap and differences below 0.1 dB up to 4.6 GHz without JJs and up to 2.4 GHz with JJs; resonances cause interruptions beyond these frequencies.[1] Thomas, J. N., Hoffmann, J., Flowers-Jacobs, N. E., Fox, A. E., Jungwirth, N. R., Johnson-Wilke, R. L., Dresselhaus, P. D., & Benz, S. P., "Cryogenic On-chip In Situ S-parameter Calibration Using Superconducting Coplanar Waveguides" submitted to the IEEE Transactions on Microwave Theory and Techniques Journal which if accepted will be published and available on IEEE website at a later date.
Patent AT-E400064-T1: [Translated] RESISTIVE TYPE CURRENT LIMITING DEVICE HAVING A HIGH-TC TAPE SUPERCONDUCTOR
공공데이터포털
A strip-shaped superconductor has a conductor structure containing at least one metallic substrate strip, a layer made of oxidic high Tc superconducting material of the AB2Cu3OX type; an oxidic buffer layer, which is arranged therebetween and which has adapted crystalline dimensions, and; a normal-conductive top layer that is applied to the superconductive layer. The buffer layer should be formed so that a transition resistance of no greater than 10-3 Omegacm2 is formed at least in partial areas between the superconductive layer and the substrate strip. For example, suitable materials are of the La-Mn-O or Sr-Ru-O or La-Ni-O or In-Sn-O type.
QFlow 2.0: Quantum dot data for machine learning
공공데이터포털
Using a modified Thomas-Fermi approximation, we model a reference semiconductor system comprising a quasi-1D nanowire with a series of five depletion gates whose voltages determine the number of quantum dots (QDs), the charges on each of the QDs, as well as the conductance through the wire. The original dataset, QFlow lite, consists of 1 001 idealized simulated measurements with gate configurations sampling over different realizations of the same type of device. Each sample data is stored as a 100 x 100-pixel map from plunger gate voltages to (i) current through the device at infinitesimal bias, (ii) output of the charge sensor evaluated as the Coulomb potential at the sensor location - the experimentally relevant parameters that can be measured, (iii) information about the number of charges on each dot (with a default value 0 for short circuit and a barrier), and (iv) a label determining the state of the device, distinguishing between a single dot, a double dot, a short circuit, and a barrier state. The expanded dataset, QFlow 2.0, consists of 1599 idealized simulated measurements stored as roughly 250 x 250-pixel maps from plunger gate voltages to (i) output of the charge sensor, (ii) net charge on each dot, and (iii) a label determining the state of the device, distinguishing between a left, central, and right single QD, a double QD, and a barrier or short circuit (no QD) state. In addition, the QFlow 2.0 dataset includes two sets of noisy simulated measurements, one with the noise level varied around 1.5 times the optimized noise level and the other one with the noise level ranging from 0 to 7 times the optimized noise level. See the "Project description" and "Data structure" documents for additional information about these datasets.Acknowledgments: This research is sponsored in part by the Army Research Office (ARO), through Grant No. W911NF-17-1-0274. The development and maintenance of the growth facilities used for fabricating samples were supported by the Department of Energy, through Grant No. DE-FG02-03ER46028. We acknowledge the use of clean room facilities supported by The National Science Foundation (NSF) through the UW-Madison MRSEC (DMR-1720415) and electron beam lithography equipment acquired with the support of the NSF MRI program (DMR-1625348). The views and conclusions contained in this document are those of the authors and should not be interpreted as representing the official policies, either expressed or implied, of the ARO or the U.S. Government. The U.S. Government is authorized to reproduce and distribute reprints for Government purposes notwithstanding any copyright noted herein. Any mention of commercial products is for information only; it does not imply recommendation or endorsement by NIST.
Differential Measurements of an AC Source with a Josephson Arbitrary Waveform Synthesizer
공공데이터포털
The abstract of the paper [1] is:This paper describes differential sampling measurements of an ac source and a Josephson arbitrary waveform synthesizer (JAWS).A new iterative approach for aligning the phases of the JAWS and the source waveforms was implemented to minimize the differential voltage at the digitizer. A type-A uncertainty of 45 nV/V after 10 min was measured for a commercial ac source at 1 V rms amplitude and 1 kHz.[1] "Differential Measurements of an AC Source with a Josephson Arbitrary Waveform Synthesizer"submitted to Conference on Precision Electromagnetic Measurements (CPEM) 2024; will be published and available on IEEE website at a later date.Data for figures 2 to 4 of the manuscript.Files included in this publication: Fig 2 FFT of the digitizer signal.csv Figure 2 Fig. 2. 1 kHz component of the FFT of the digitizer signal (amplitude and phase) for Delta_V1=Source-JAWS1 and Delta_V2=Source-JAWS2 over 3.5 hours Five columns: The first column is the time (x-axis), the second column is the amplitude in volt of the first measured difference voltage (shown as black solid circle in Fig. 2), the third column is the phase in degree of the first measured difference voltage (shown as black open circle in Fig. 2), the fourth column is the amplitude in volt of the second measured difference voltage (shown as red solid circle in Fig. 2), the fifth column is the phase in degree of the second measured difference voltage (shown as red open circle in Fig. 2). Format: CSV Fig 3 Source rms amplitude and environment data.csv Figure 3 Fig. 3. Room environment conditions recorded (temperature, atmospheric pressure, and relative humidity) and Reconstructed rms amplitude for the source at 1 kHz. Five columns: The first column is the time (x-axis), the second column is the reconstructed amplitude in volt - 1 V (shown as blue solid circle in Fig. 3 bottom), the third column is the temperature in degree C (shown as orange solid square in Fig. 3 top), the fourth column is the atomsepheric pressure in hecto Pascal (shown as green open triangle in Fig. 3 top), the fifth column is the relative humidity in percent (shown as puple open circle in Fig. 2). Format: CSV Fig 4 Allan variance.csv Figure 4 Fig. 4. Allan deviation of the source amplitude measured at 1 V and 1 kHz. Five columns: The first column is the time (x-axis), the second column is the calculated Allan Deviation in volt (shown as blue solid circle in Fig. 4), the third column is the fit on the results, representing the white noise with slope -0.5 (shown as black dash line in Fig. 4), the fourth column is the is the time (x-axis) for the 1/f noise floor plot and the fifth column is the 1/f noise floor (shown as a black solid line in Fig. 4) Format: CSV