The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. All of it is collected and is stored in JSON files. The files are highly self-descriptive of their content, and contain angles, intensities, temperatures, and other environmental parameters, along with metadata.

The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. Almost all of it is collected using scintillator point detector with a graphite analyzer, and is stored in CIF format.

The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. Almost all of it is collected using scintillator point detector with a graphite analyzer, and is stored in CIF format.

These datasets are the high-resolution data collected at the APS 11-BM synchrotron beamline, and used to certify the microstructural characteristics of the two components (15 nm and 60 nm nominal microscrystallites) of SRM 1979. They are presented as CIF files containing the data as collected and processed by the 11BM software to make uniformly-spaced angle step data files. Each CIF contains the 'raw' data from 11BM, the same data with an angular scale corrected by refinement of SRM660c data collected in the same run, and finally a computed data set from a Rietveld structural fit to the results. There are 9 CIF files in the ZIP archive. Each file is names xxxx_yy_nm_zzz.cif where xxxx is the run number at APS under which the data were collected, yy is either 15 or 60 for the nominal crystallite size, and zzz is the bottle number form the random sampling of the SRM used to take this measurement.

These datasets are the high-resolution data collected at the APS 11-BM synchrotron beamline, and used to certify the microstructural characteristics of the two components (15 nm and 60 nm nominal microscrystallites) of SRM 1979. They are presented as CIF files containing the data as collected and processed by the 11BM software to make uniformly-spaced angle step data files. Each CIF contains the 'raw' data from 11BM, the same data with an angular scale corrected by refinement of SRM660c data collected in the same run, and finally a computed data set from a Rietveld structural fit to the results. There are 9 CIF files in the ZIP archive. Each file is names xxxx_yy_nm_zzz.cif where xxxx is the run number at APS under which the data were collected, yy is either 15 or 60 for the nominal crystallite size, and zzz is the bottle number form the random sampling of the SRM used to take this measurement.

Materials discovery and development necessarily begins with the preparation and identification of product phase(s). Crystalline compounds can be identified by their characteristic diffraction patterns using X-rays, neutrons, and or electrons. An estimated 20,000 X-ray diffractometers and a comparable number of electron microscopes are used daily in materials research and development laboratories for this purpose. Access to crystal structure data is a critical step in solving research and applications problems in materials researches, and these data are of interest to analysts in areas such as materials design, property prediction and compound identification. NIST Crystallographic Data Center, in collaboration with partners all over the world, evaluates and disseminates chemical, physical and crystallographic information published on these materials. NIST Standard Reference Database 3: NIST Inorganic Crystal Structure Database (NIST ICSD) is a comprehensive collection of crystal structure data of nonorganic compounds (including inorganics, ceramics, minerals, pure elements, metals, and intermetallic systems) containing over 210,000 entries and covering the literature from 1913. NIST ICSD includes entries that fall into the following categories: full structure data from experimental refinement or derived from their iso-structural structure types, theoretically predicted structures from computer simulations, as well as partially characterized structures. The NIST ICSD web application provides materials researchers with a user-friendly interface to search the database based on bibliographic information, chemistry, unit cell, space group, experimental settings, mineral name/group and other derived data from expert evaluation. In addition, it also provides users with functions to easily create and examine results from various crystallographic computations, such as reduced cell, bond distance/angle, calculated powder diffraction data, and structure standardization.

The data set contains all of the raw spectra for the XAFS data analysis and the data that was used to generate the figures and table in the manuscript and supporting information. The XAFS data requires the use of Demeter Software to access. This dataset is associated with the following publication: Clar, J., W. Platten, E. Baumann, A. Remsen, S. Harmon, C. Bennett-Stamper, T. Thomas, and T. Luxton. Dermal transfer and environmental release of CeO2 nanoparticles used as UV inhibitors on outdoor surfaces: Implications for human and environmental health. ENVIRONMENTAL POLLUTION. Elsevier Science Ltd, New York, NY, USA, 714-723, (2018).

EDS spectra measured at E0 = 5 keV for 75 materials are provided along with the standards used for quantification with the NIST DTSA-II software for electron-excited X-ray microanalysis with energy dispersive spectrometry.The data sets are organized according to the analytical instrument platform used, and an EDS detector configuration appropriate to each EDS spectrometer is provided . Each folder contains spectra for that specific material and the standards used as well as an Excel file summarizing the DTSA-II results in terms of the raw mass concentrations, normalized mass concentrations, and atomic concentrations. Each calculated compositional value is accompanied by the uncertainty budget as estimated by DTSA-II.An Excel file (5keV_accuracy_summary_DTSA-II) containing an overall summary of results for all 75 materials is provided.

EDS spectra measured at E0 = 5 keV for 75 materials are provided along with the standards used for quantification with the NIST DTSA-II software for electron-excited X-ray microanalysis with energy dispersive spectrometry.The data sets are organized according to the analytical instrument platform used, and an EDS detector configuration appropriate to each EDS spectrometer is provided . Each folder contains spectra for that specific material and the standards used as well as an Excel file summarizing the DTSA-II results in terms of the raw mass concentrations, normalized mass concentrations, and atomic concentrations. Each calculated compositional value is accompanied by the uncertainty budget as estimated by DTSA-II.An Excel file (5keV_accuracy_summary_DTSA-II) containing an overall summary of results for all 75 materials is provided.