3D solid model of NIST Nanocalorimeter
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3D Solid Model of NIST Nanocalorimeter created in Solidworks 2019. The files include an assembly of three layers represented as part files - the silicon die layer, the silicon nitride membrane layer and the platinum metal layer. Please cite the related paper "Practical Guide to the Design, Fabrication and Calibration of NIST Nanocalorimeters" by Feng Yi, Michael D. Grapes, and David A. LaVan in the Journal of Research of the National Institute of Standards and Technology, Volume 124 (in press).
ACerS-NIST Phase Equilibria Diagrams Database - SRD 31
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The data in the ACerS-NIST Phase Equilibria Diagrams Database, jointly copyrighted by NIST and The American Ceramic Society, provide maps of the equilibrium chemical and structural behaviors exhibited by inorganic systems and provide critical starting information for the rational design of materials processing schemes, for quality assurance efforts, and for optimization of the physical and chemical properties of advanced materials. The contents of this database consist of approximately 25,000 equilibrium phase diagrams presented in 17,866 critically evaluated entries (PED Figures). The materials covered include a wide range of non-organic material-types including oxides and mixed systems with oxides, chalcogenides (sulfides, selenides, tellurides), pnictides (N, P, As, Sb, Bi), actinides (U, Pu, Th) and actinide-surrogates (Ce), oxycation systems (e.g. molybdates, vanadates), semiconductors (Si, Ge, Sn), group 3 systems (B, Al, Ga, In, Tl), and salts including mixed systems with salts. The data are pertinent to a wide variety of applications including optoelectronics, thermal-barrier coatings, sensors, energy converters, nuclear waste reprocessing, nuclear reactors, photovoltaics, pigments, fuel cells, catalysts, thermoelectrics, capacitors, transducers, thermoluminescence, molten-salt batteries, photovoltaics, electrolytic refining, and semiconductor manufacturing. A free demonstration CDROM which includes a comprehensive Cumulative Index for the entire database is available upon request or can be downloaded from the website http://www.nist.gov/srd/nist31.cfm.
NIST Triatomic Spectral Database - SRD 117
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This data base contains the rotational spectral lines observed and reported in the open literature for 55 triatomic molecules through June 1976. The isotopic molecular species, assigned quantum numbers, observed frequency, estimated measurement uncertainty and reference are given for each transition reported. In addition to correcting a number of misprints and errors in the literature cited, the spectral lines for approximately 15 molecules have been refit to produce a comprehensive and consistent analysis of all the data extracted from various literature sources. Both measured and predicted transition frequencies are listed for several isotopic forms of HCN, H2O, H2S, and OCS. The derived molecular properties, such as rotational and centrifugal distortion constants, hyperfine structure constants, electric dipole moments, and rotational g-factors are listed with one standard deviation uncertainty for all values.
NIST X-ray Photoelectron Spectroscopy Database - SRD 20
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NIST X-ray Photoelectron Spectroscopy Database XPS contains over 33,000 data records that can be used for the identification of unknown lines, retrieval of data for selected elements (binding energy, Auger kinetic energy, chemical shift, and surface or interface core-level shift), retrieval of data for selected compounds (according to chemical name, selected groups of elements, or chemical classes), display of Wagner plots, and retrieval of data by scientific citation. For the newer data records, additional information is provided on the specimen material, the conditions of measurement, and the analysis of the data. Version 5.0 includes the addition of Digital Object Identifiers (DOI) to each of the citations. Additionally, Version 5.0 has new features including chemical shift plots, custom-built components for displaying both formatted molecular formulas and formatted spectral lines, and spectral sorting functions of photoelectron lines and Auger Parameters.