Cryogenic On-chip In Situ S-parameter Calibration Using Superconducting Coplanar Waveguides
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These data will appear in [1]. The abstract for that paper is given below:This paper presents a new multi-impedance-state line (MISL) in situ scattering parameter (S-parameter) calibration technique using on-chip superconducting transmission lines at 4 K that enables cryogenic calibration in a fixed signal path without the need for cryogenic switches or a cryogenic probe station. The method uses coplanar waveguide (CPW) models based on various impedance states of niobium (Nb), which has zero dc resistance below 9 K and a monotonically increasing resistance from 10 K to room temperature. The different impedance states are accessed by heating the 4 K stage of a cryostat and injecting up to 245 mA of current into the line. Using these states, we solve for the unknowns in an 8-term error model through a least-squares analysis. We first validate the MISL calibration technique by comparing it with short-open-load-reciprocal (SOLR) calibrated measurements in a cryogenic probe station, finding transmission agreement within 0.2 dB and uncertainty overlap for nearly all frequencies up to 26.5 GHz. We then apply the method to calibrate Nb CPWs with and without embedded Josephson junctions (JJs), using a fixed wire bonded connection, and without the use of cryogenic switches or movable probes. Strong agreement with the CPW models is demonstrated, with uncertainty overlap and differences below 0.1 dB up to 4.6 GHz without JJs and up to 2.4 GHz with JJs; resonances cause interruptions beyond these frequencies.[1] Thomas, J. N., Hoffmann, J., Flowers-Jacobs, N. E., Fox, A. E., Jungwirth, N. R., Johnson-Wilke, R. L., Dresselhaus, P. D., & Benz, S. P., "Cryogenic On-chip In Situ S-parameter Calibration Using Superconducting Coplanar Waveguides" submitted to the IEEE Transactions on Microwave Theory and Techniques Journal which if accepted will be published and available on IEEE website at a later date.
NIST High Temperature Superconducting (HTS) Materials Database - SRD 62
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The NIST WWW High Temperature Superconductors database (WebHTS) provides evaluated thermal, mechanical, and superconducting property data for oxide superconductors. The range of materials covers the major series of compounds derived from the Y-Ba-Cu-O, Bi-Sr-Ca-Cu-O, Tl-Sr-Ca-Cu-O, and La-Cu-O chemical families, along with numerous other variants of the cuprate and bismuthate materials that are known to have superconducting phases. The materials are described by specification and characterization information that includes processing details and chemical compositions. Physical characteristics such as density and crystal structure are given in numeric tables. All measured values are evaluated and supported by descriptions of the measurement methods, procedures, and conditions. In all cases, the sources of the data are fully documented in a comprehensive bibliography.
Dataset presenting improved bandwidth in Rydberg atom electrometry with an optical frequency comb probe
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Rydberg atom-based receivers of modulated radio frequency (RF) fields are promising systems for measurements. These systems are self-calibrating, widely tunable, nearly transparent to RF fields, and can be electrically small. However, the instantaneous bandwidth of current Rydberg atom receivers is typically less than 1 MHz. Using two-photon electromagnetically induced transparency (EIT) to observe the 56D5/2 Rydberg state in cesium, we measure modulation sidebands on each tooth in a probe optical frequency comb that spans the D2 F=4-F'=5 transition resulting from transmission modulation of the probe beam. This transmission modulation occurs from changes in susceptibility of the room temperature cesium vapor as two RF fields impinge on the atoms. A strong RF local oscillator is resonant with the 56D-57P state and mixes with a weak RF signal field detuned from the RF LO by an intermediate frequency. Using a self-heterodyned electro-optic comb setup, we separate positive and negative sideband amplitudes and compare to an equivalent comb-free system. These data report EIT measurement with the comb system, local spectra around two comb teeth - one within and one outside the EIT line, and normalized minimum detectable RF signal field as a function of RF intermediate frequency used to evaluate the instantaneous bandwidth of the single frequency, positive sideband, and negative sideband datasets.
NIST Electron Elastic-Scattering Cross-Section Database - SRD 64
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Note that this SRD supersedes SRD 64 Version 3.2. The NIST Electron Elastic-Scattering Cross-Section Database provides values of differential elastic-scattering cross sections, total elastic-scattering cross sections, phase shifts, and transport cross sections in electron-atom scattering for elements with atomic numbers from 1 to 96 and for electron energies between 50 eV and 300 keV (in steps of 1 eV). Knowledge of elastic-scattering effects is important for the development of theoretical models for quantitative analysis by Auger-electron spectroscopy, X-ray photoelectron spectroscopy, electron microprobe analysis, and analytical electron microscopy. These data are also needed for modeling of electron transport in radiation dosimetry, electron-beam lithography, and interactions of ionizing radiation with matter. The database is designed to facilitate simulations of electron transport for these and similar applications in which electron energies from 50 eV to 300 keV are utilized. An analysis of available elastic-scattering cross-section data has been published [A. Jablonski, F. Salvat, and C. J. Powell, J. Phys. Chem. Ref. Data 33, 409 (2004)].