Broadband S-parameter measurements of Parylene C microwave microfluidic devices from 100 MHz - 110 GHz. The Parylene C devices consisted of 400 nm platinum coplanar waveguides (CPW) (50 um center conductor, 5 um gaps, 200 um ground planes) deposited on fused silica with 6.5 um of Parylene C on top, capped with a PDMS microfluidic layer aligned over the CPWs. The dimensions of the PDMS microfluidic channels were approximately 210 um wide by 100 um deep. The total CPW line length was 10.000 mm and the channel length was 4.160 mm, where the channel was aligned over the center of the CPW. We measured the S-parameters of Parylene C devices filled with three different fluid conditions at different intervals over a 2 month period: H2O at 20 degrees Celsius, 1xPBS (phosphate-buffered saline) at 20 degrees Celsius, and 1xPBS at 37 degrees Celsius. We obtained measurements of both the fluid-filled and empty channel at each measurement day. We measured broadband S-parameters with a vector network analyzer and extender heads at a source power of -17 dBm on a temperature-controlled probe station. The S-parameters were calibrated to the probe tips with measurements of a gold reference chip in combination with multiline TRL in the NIST Microwave Uncertainty Framework. The differences in S-parameters from day 0 were plotted over time to observe changes in the dielectric properties of the Parylene C device during soaking.

We obtained stylus profilometry measurements of Parylene C devices after soaking in different fluid conditions in a microfluidic environment. The Parylene C devices consist of platinum coplanar waveguides (400 nm Pt, 50 um center conductor, 5 um gaps, 200 um ground planes) with 6.5 um of Parylene C deposited on top. A PDMS microfluidic layer was aligned on top of the 10.00 mm CPW such that the 4.00 mm channel was centered on the CPW. The Parylene C device was subjected to one of three fluid conditions over a 2 month soaking period: H2O at 20 degrees Celsius, 1xPBS (phosphate-buffered saline) at 20 degrees Celsius, or 1xPBS at 37 degrees Celsius. The cross-sectional profile of the CPW was measured in three locations along the channel before and after soaking in each fluid. Here we give these topographical profiles for each Parylene C device we measured.

Electromagnetic simulations of Parylene C devices, described in "The influence of intrinsic water and ion permeation of the dielectric properties of Parylene C films". We simulated various geometries of the device with different fluids inside and calculated S-parameters from extracted RLCG results. We also provide scripts to work up the simulation results into S-parameter plots.

Electromagnetic simulations of Parylene C devices, described in "The influence of intrinsic water and ion permeation of the dielectric properties of Parylene C films". We simulated various geometries of the device with different fluids inside and calculated S-parameters from extracted RLCG results. We also provide scripts to work up the simulation results into S-parameter plots.

This data set contains data used to generate plots in the paper "Microwave Characterization of Parylene C Dielectric and Barrier Properties".It contains the broadband S-parameter measurements of Parylene C coated CPWs exposed to water and ionic fluid, simulation set-up files and RLCG results, formatted data for each of the plots, and scripts to generate each figure.Simulations must be opened using ANSYS Electronics Desktop.Scripts must be executed using MATLAB.See readme file for complete description of each individual file.

This data set contains data used to generate plots in the paper "Microwave Characterization of Parylene C Dielectric and Barrier Properties".It contains the broadband S-parameter measurements of Parylene C coated CPWs exposed to water and ionic fluid, simulation set-up files and RLCG results, formatted data for each of the plots, and scripts to generate each figure.Simulations must be opened using ANSYS Electronics Desktop.Scripts must be executed using MATLAB.See readme file for complete description of each individual file.

This data publication contains the mass spectrometry chemical characterization of microplastic and nanoplastic chemical analysis. The data from this study includes mass spectra of pure, mixed, and weathered microplastics and nanoplastics at high and low fragmentation, extracted ion chronograms, Kendrick mass defect plots, code, and the derived and processed data. The data analysis code (MATLAB 2022a*) used for unsupervised learning of cluster and compositional relationships is also included. The code employs principal component analysis for dimensionality reduction, learns the resulting datasets' latent dimensionality, and completes Gaussian mixture modeling and fuzzy c-means clustering.*Any mention of commercial products is for information only; it does not imply recommendation or endorsement by NIST.

Single-track laser scans were produced with Yb-fiber lasers on bare plates of IN625 and IN718 using three different laser powder bed fusion machines. The laser power, scan speed, and laser spot diameter varied. Tracks were cross-sectioned and metallographically prepared. Optical micrographs were taken on etched samples. Melt pool depth and width measurements were made on optical micrographs. The dataset includes optical micrographs and melt pool width and depth measurements. These are supplemental experiments to the single-track laser scans for Additive Manufacturing Benchmark 2018 and 2022 challenges (https://www.nist.gov/ambench/am-bench-data-and-challenge-problems-0). Some of the data is associated with publications (1) https://doi.org/10.1016/j.jmapro.2021.10.053 and (2) https://doi.org/10.1007/s40192-022-00289-w.Users are strongly encouraged to first review the ?Master_TrackList_Measuremetns.xlsx? file for description of each image file.

Figures and relevant data from the paper "Broadband Electromagnetic Properties of Engineered Flexible Absorber Materials" are found here . The paper was published on Advanced Materials Technologies in 2023. ABSTRACT: Flexible and stretchable materials have attracted significant interest for applications in wearable electronics and bioengineering fields. Recent developments also incorporate mounted and embedded microwave circuits, components, and systems with engineered flexible materials that operate over a broadband frequency range (~1 to 100 GHz). Here we demonstrate a simple, low-cost, flip-chip technique where flexible materials are placed on top of coplanar waveguide (CPW) transmission lines for material property measurement. We apply on-wafer error correction and de-embedding techniques to determine broadband electromagnetic properties of the material-loaded transmission line segments. Finite-element simulations of material-loaded devices were employed along with the broadband measurements to estimate the electromagnetic material properties. To demonstrate this technique, we fabricated flexible polydimethylsiloxane (PDMS) composites with varying concentrations of Barium Hexaferrite (BaM) nanoparticles for potential applications in electromagnetic shielding and quantified the complex permittivity and permeability of the composites up to 110 GHz using our broadband scattering-parameter measurements. We fit the frequency-dependent permeability to models describing the ferromagnetic resonance of barium hexaferrite (BaM) nanoparticles in PDMS and estimated the constituent nanoparticle properties using the Maxwell-Garnett mixing model. This study paves way to exploit a wide range of engineered materials in flexible, wearable, and biomedical electronics applications and presents a convenient methodology to extract important broadband electromagnetic properties for applications such as electromagnetic shielding.

Fused silica has become an interesting alternative to silicon for millimeter-wave (mmWave) applications. Unfortunately, there are few reports on the measurement of fused silica’s permittivity above 110 GHz that use electrical rather than optical methods. Given that mmWave applications use electrical circuits, additional electrical data would be useful to industry. To test the feasibility of electrical methods, we applied on-wafer techniques based on coplanar waveguide transmission lines to measure the complex permittivity of fused silica to 325 GHz. Our approach used the multiline thru reflect line algorithm on the scattering parameter measurements of transmission lines. Our method combined these results with dc measurements of the resistivity of the metals, simulations of the coplanar waveguide cross section, and dimensional metrology. The resulting complex permittivity was epsilon_r = 3.87±0.03 and a loss tangent tan_delta < 0.005 from 320 MHz to 325 GHz. To support our conclusions, we performed an uncertainty analysis considering relevant sources of uncertainty. In the broader context, these results show that fused silica is a suitable substrate for mmWave electronics where the loss tangent must be less than 0.005 up to 325 GHz.